Applied Quantum Machine Learning on PCB Multi-Class Defect Detection

Published in 2026 International Conference on Quantum Communications, Networking, and Computing (QCNC), pp. 1–6, 2026

This paper evaluates quantum machine-learning methods for industrial multi-class defect detection in printed-circuit-board inspection.

Recommended citation: Huang, C.-W.; Chen, K.-C.; and Lai, C.-J. (2026). "Applied Quantum Machine Learning on PCB Multi-Class Defect Detection." IEEE QCNC 2026, pp. 1–6.